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Ȩ Ȩ > ¿¬±¸¹®Çå > Çмú´ëȸ ÇÁ·Î½Ãµù > Çѱ¹Á¤º¸Åë½ÅÇÐȸ Çмú´ëȸ > 2010³â Ãá°èÇмú´ëȸ

2010³â Ãá°èÇмú´ëȸ

Current Result Document : 3 / 5 ÀÌÀü°Ç ÀÌÀü°Ç   ´ÙÀ½°Ç ´ÙÀ½°Ç

ÇѱÛÁ¦¸ñ(Korean Title) ¸®µåÇÁ·¹ÀÓ °Ë»ç ½Ã½ºÅÛÀÇ °³¹ß
¿µ¹®Á¦¸ñ(English Title) Development of Lead-frame Inspection Equipment
ÀúÀÚ(Author) ±è¿µ±Ô   ±èÁø¿í   À̼®±â   ±è¼®Å   Young-gyu Kim   Jin-wook Kim   Seok-ki Lee   Seok-tae Kim  
¿ø¹®¼ö·Ïó(Citation) VOL 14 NO. 01 PP. 0574 ~ 0576 (2010. 05)
Çѱ۳»¿ë
(Korean Abstract)
º» ³í¹®¿¡¼­´Â CCD Ä«¸Þ¶ó¸¦ ÀÌ¿ëÇØ ¸®µåÇÁ·¹ÀÓÀÇ ³»ºÎ ¸®µåºÎÀÇ ³ÐÀÌ¿Í ¼±¸íµµ ¹× °áÇÔ µîÀ» °í¼ÓÀ¸·Î °Ë»çÇÏ´Â ½Ã½ºÅÛÀ» °³¹ßÇÑ´Ù. º» ½Ã½ºÅÛÀº Á¶¸íºÎ, °Ë»çºÎ, Á¶¸í Á¦¾îºÎ, GUI µîÀ¸·Î ±¸¼ºµÈ´Ù. °³¹ß ±â¼ú·Î´Â Á¶¸í Á¦¾î, °í¼Ó °Ë»ç ¾Ë°í¸®Áò, °Ë»ç ºÐÇØ´ÉÀ» ¿Ã¸®±â À§ÇÑ °èÃø±â¼ú µîÀÌ´Ù. ÇöÀå ½ÇÇèÀ» ÅëÇØ °³¹ßµÈ ½Ã½ºÅÛÀÇ À¯È¿¼ºÀ» °ËÁõÇÑ´Ù.
¿µ¹®³»¿ë
(English Abstract)
In this paper, we propose a development of high speed inspection system which allows the inspection of width, definition and flaws in lead-frame using CCD camera. This system consists of the parts of lighting, inspection, lighting control , GUI and more and developed techniques used are lighting control, fast inspection algorithm and advanced measurement technique for improvement in resolution. The effectiveness in proposed method is proved by conducting field tests.
Å°¿öµå(Keyword) lead-frame   inspection system   lighting control   fast inspection algorithm   advanced Measurement technique  
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