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Çмú´ëȸ ÇÁ·Î½Ãµù

Ȩ Ȩ > ¿¬±¸¹®Çå > Çмú´ëȸ ÇÁ·Î½Ãµù > Çѱ¹Á¤º¸°úÇÐȸ Çмú´ëȸ > 2011³â Ãß°è Çмú´ëȸ

2011³â Ãß°è Çмú´ëȸ

Current Result Document : 14 / 17 ÀÌÀü°Ç ÀÌÀü°Ç   ´ÙÀ½°Ç ´ÙÀ½°Ç

ÇѱÛÁ¦¸ñ(Korean Title) Model Driven Architecture ±â¹ÝÀÇ ÀÓº£µðµå Å×½ºÆ® ÇÁ·Î¼¼½º¿¡ °üÇÑ ¿¬±¸
¿µ¹®Á¦¸ñ(English Title) A Study on Embedded Test Process based on Model Driven Architecture
ÀúÀÚ(Author) ±èµ¿È£   ¼ÕÇö½Â   ±è¿ì¿­ ±è¿µÃ¶   Dongho Kim   Hyunseung Son   Wooyeol Kim   R. Youngchul Kim  
¿ø¹®¼ö·Ïó(Citation) VOL 38 NO. 2(B) PP. 0180 ~ 0182 (2011. 11)
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(Korean Abstract)
ÇöÀç ´Ù¾ç ÀÌÁ¾ÀÇ ÀÓº£µðµå ½Ã½ºÅÛÀÌ È°¿ë°ú ¼ÒÇÁÆ®¿þ¾î°¡ Â÷ÁöÇÏ´ø ºñÁßÀÌ ³ô¾ÆÁ®°¨¿¡ µû¶ó ¼ÒÇÁÆ®¿þ¾îÀÇ °ËÁõÀÌ Á߿伺ÀÌ ³ô¾ÆÁ³´Ù. ±×·¡¼­ ´Ù¾çÇÑ ÀÌÁ¾ ¸ð¹ÙÀÏ Ç÷§Æû¿¡ ¸Â´Â ¼ÒÇÁÆ®¿þ¾î ½Ã½ºÅÛÀÇ ºü¸£°í ¾ÈÁ¤ÀûÀΠ°³¹ß°ú Ã¼°èÀû ½ÃÇèÀ» À§ÇØ ÀÓº£µðµå ½Ã½ºÅÛ¿ë Å×½ºÆ® ÇÁ·Î¼¼½º°¡ ÇÊ¿äÇÏ´Ù. À̸¦ ÇØ°á°íÀÚ, ±âÁ¸¿¡ MDA ±â¹ýÀ» Àû¿ëÇØ´ø ÀÓº£µðµå °³¹ß ÇÁ·Î¼¼½º¿¡, µ¿½Ã¿¡ Å×½ºÆ® ÇÁ·Î¼¼½º¿¡ Ãß°¡ Àû¿ëÀ» Á¦¾È ÇÑ´Ù. À̴ ´Ù¾çÇÑ Ç÷§ÆûÀÇ °³¹ß°ú ´õºÒ¾î Ã¼°èÀûÀΠÅ×½ºÆ®µµ º¸°­ÀÌ ÇÏ°íÀÚ ÇÑ´Ù. º» ³í¹®¿¡¼­´Â ÀÌÁ¾ ÀÓº£µðµå Å×½ºÆø¦ À§ÇØ ´ÙÁß V ¸ðµ¨¿¡ MDA ¸ÞÄ«´ÏÁò¸¦ Àû¿ëÇÏ¿´´Ù. À̸¦ À§ÇØ °³¹ß ´Ü°è¿¡ ¸ÂÃç µ¿½Ã¿¡ Å×½ºÆ® ÇÁ·Î¼¼½ºÀÇ ´Ü°è, È°µ¿, ÀÛ¾÷, »êÃâ¹°À» Á¤ÀÇÇÏ°í À̸¦ ÅëÇØ °³¼±µÈ ´ÙÁß V ±â¹Ý ¸ðµ¨ ±â¹Ý Å×½ºÆÿ¡ Àû¿ëÇϹǷνá, ´Ù¾çÇѠŸ°ÙÀÇ Å×½ºÆÃÀ» Áö¿øÇÏ°íÀÚ ÇÑ´Ù.

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(English Abstract)
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