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Ȩ Ȩ > ¿¬±¸¹®Çå > ±¹³» ³í¹®Áö > Çѱ¹Á¤º¸°úÇÐȸ ³í¹®Áö > Á¤º¸°úÇÐȸ ÄÄÇ»ÆÃÀÇ ½ÇÁ¦ ³í¹®Áö (KIISE Transactions on Computing Practices)

Á¤º¸°úÇÐȸ ÄÄÇ»ÆÃÀÇ ½ÇÁ¦ ³í¹®Áö (KIISE Transactions on Computing Practices)

Current Result Document :

ÇѱÛÁ¦¸ñ(Korean Title) µö·¯´×À» ÀÌ¿ëÇÑ HWSW °áÇÔ ±¸ºÐ ÀÚµ¿È­
¿µ¹®Á¦¸ñ(English Title) HWSW Defects Classification using Deep Learning
ÀúÀÚ(Author) ¹ÚÁöÇö   ±è¿¬Èñ   ÃÖº´ÁÖ   Jihyun Park   Yeonhee Kim   Byoungju Choi  
¿ø¹®¼ö·Ïó(Citation) VOL 49 NO. 04 PP. 0239 ~ 0249 (2022. 04)
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(Korean Abstract)
¼ÒÇÁÆ®¿þ¾îÀÇ Ç°ÁúÀ» Çâ»ó½ÃÅ°±â À§Çؼ­´Â °áÇÔÀ» ºü¸£°Ô ã¾Æ³»°í ÇØ°áÇØ¾ß ÇÑ´Ù. ±×·¯³ª ÀÓº£µðµå ½Ã½ºÅÛ¿¡¼­´Â Çϵå¿þ¾î¿Í ¼ÒÇÁÆ®¿þ¾î°¡ ¹ÐÁ¢ÇÏ°Ô ¿¬°üµÇ¾î µ¿ÀÛÇϹǷΠ°áÇÔÀÌ ¹ß»ýÇÏ¿´À» ¶§ ±× °áÇÔÀÌ Çϵå¿þ¾î °áÇÔÀÎÁö ¼ÒÇÁÆ®¿þ¾î °áÇÔÀÎÁö¸¦ ±¸ºÐÇϱⰡ ¾î·Æ´Ù. °áÇÔÀ» ±¸ºÐÇØÁÖ±â À§ÇÑ ¿¬±¸°¡ ÁøÇàµÇ¾úÀ¸³ª, °áÇÔÀ» ±¸ºÐÇÒ ¶§ ³×Æ®¿öÅ©ÀÇ »óųª SWÀÇ ½ÇÇà »óȲ µîÀ» °í·ÁÇÏÁö ¾Ê¾Æ ½Ã½ºÅÛ¿¡ µû¶ó °áÇÔ ±¸ºÐÀÇ Á¤È®µµ°¡ ¶³¾îÁö°Ô µÈ´Ù. º» ³í¹®¿¡¼­´Â °áÇÔÀ» ±¸ºÐÇÒ ¶§ µö·¯´×À» ÀÌ¿ëÇÏ¿© °áÇÔ ±¸ºÐ¿¡ »ç¿ëÇÏ´Â ¸ÞÆ®¸¯À» Á¶ÀýÇÏ°í À̸¦ °áÇÔ ±¸ºÐ¿¡ È°¿ëÇÔÀ¸·Î½á °áÇÔ ±¸ºÐÀÇ Á¤È®¼ºÀ» ³ô¿©ÁÖ´Â ÀÚµ¿È­ ¹æ¾ÈÀ» Á¦¾ÈÇÑ´Ù. Á¦¾ÈÇÏ´Â ¹æ¾ÈÀº ±âÁ¸ÀÇ °áÇÔ ±¸ºÐ ¹æ¾ÈÀÇ °áÇÔ ±¸ºÐÀ² 94.85%º¸´Ù ³ôÀº 98.38%ÀÇ °áÇÔ ±¸ºÐÀ²À» º¸¿©ÁÖ¾ú´Ù. ÀÌ·¯ÇÑ °á°ú´Â µö·¯´×À» ÀÌ¿ëÇÏ¿© ¸ÞÆ®¸¯À» º¯°æÇÔÀ¸·Î½á °áÇÔ ±¸ºÐ¿¡ ½Ã½ºÅÛÀÇ Æ¯¼ºÀ» ¹Ý¿µÇÑ °ÍÀÌ °áÇÔ ±¸ºÐ ¼º´É¿¡ È¿°úÀûÀÎ ¿µÇâÀ» ¹ÌÄ¡´Â °ÍÀ» º¸¿©ÁØ´Ù.
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(English Abstract)
To improve the quality of software, defects must be found and resolved quickly. In embedded systems, hardware and software are tightly coupled. Therefore it is difficult to distinguish whether a defect is a hardware defect or a software defect when a defect occurs. Many studies have been conducted to classify defects; however, since network state or software execution is not considered when classifying defects, the accuracy of defects classification is lowered depending on the system. In this paper, we propose an automated method that improves the accuracy of defects classification by adjusting the metric used for defects classification using deep learning. The proposed method has a defect classification rate of 98.38%, which is higher than a defect classification rate of 94.85% of an existing method. These results show that by adjusting the metric using deep learning, reflecting the characteristics of the system in the defects classification effectively affects the performance.
Å°¿öµå(Keyword) °áÇÔ ±¸ºÐ   HWSW °áÇÔ   ÀÓº£µðµå ¼ÒÇÁÆ®¿þ¾î   µö·¯´×   defects classification   HWSW defects   embedded software   deep learning  
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