Çѱ¹Á¤º¸Åë½ÅÇÐȸ ³í¹®Áö (Journal of the Korea Institute of Information and Communication Engineering)
ÇѱÛÁ¦¸ñ(Korean Title) |
COG ĨÀÇ ¾ó¶óÀÎÀ» À§ÇÑ ¿µ¿ªºÐÇÒ ÆÐÅϸÅĪ |
¿µ¹®Á¦¸ñ(English Title) |
The Area Segmentation Pattern Matching for COG Chip Alignment |
ÀúÀÚ(Author) |
±èÀº¼®
¿ÕÁö³²
EUNSEOK KIM
GI-NAM WANG
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¿ø¹®¼ö·Ïó(Citation) |
VOL 09 NO. 06 PP. 1282 ~ 1287 (2005. 10) |
Çѱ۳»¿ë (Korean Abstract) |
¼ö ¸¶ÀÌÅ©·Î ´ÜÀ§·Î °èÃøµÇ´Â ¹ÝµµÃ¼ COGÀÇ ºÒ·® °Ë»ç¿¡ ÀÖ¾î¼ Ä¨ ¾ó¶óÀÎÀº °Ë»çÀÇ Á¤È®¼ºÀ» ³ôÀ̴µ¥ ¸Å¿ì Áß¿äÇÑ ¿ªÇÒÀ» ÇÑ´Ù. º» ³í¹®¿¡¼´Â Ĩ ¾ó¶óÀÎÀÇ Á¤È®¼ºÀ» ³ôÀ̱â À§Çؼ ¿µ¿ªºÐÇÒ ÆÐÅϸÅĪ ¹æ¹ýÀ» Á¦¾ÈÇÑ´Ù. ¿µ¿ªºÐÇÒ ÆÐÅϸÅĪ ¹æ¹ýÀº ¼¼ºÐÈ µÈ ¿µ¿ª ³»ÀÇ Æ¯Â¡Ä¡µé°ú ¿µ¿ªµé °£ÀÇ »ó°ü°ü°è¸¦ ºñ±³ÇÏ¿© ¸ÅĪµÈ´Ù. ±×¸®°í ºÒ·® ÆÐÅÏÀ¸·Î ÀÎÇÑ ¸ÅĪ¿À·ù¸¦ ÃÖ¼ÒÈ Çϱâ À§Çؼ ÆÐÅÏ ÁÖÀ§ÀÇ 3¿µ¿ªÀ» ÇнÀ½ÃŲ´Ù. Á¦¾ÈµÈ ¹æ¹ýÀº ºÐÇÒ µÈ ¿µ¿ª¿¡¼ Ư¡ġ¸¦ ã±â ¶§¹®¿¡ ¸ÅĪ ½Ã°£À» ´ÜÃà½ÃÅ°´Â È¿°ú¿Í Á¤È®¼ºÀ» ³ôÀÏ ¼ö ÀÖ´Â ÀÌÁ¡À» °¡Áö°í ÀÖ´Ù.
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¿µ¹®³»¿ë (English Abstract) |
The accuracy of chip alignment in inferior product inspection of COG(Chip On Glass) to be measured a few micro unit is very important role since the accuracy of chip inspection depends on chip alignment. In this paper, we propose the area segmentation pattern matching method to enhance the accuracy of chip alignment. The area segmentation pattern matching method compares, and matches correlation coefficients between the characteristic features within the detailed area and the areas. The three areas of pattern circumference are learned to minimize the matching error by bad pattern. The proposed method has advantage such as reduction of matching time, and enhanced accuracy since the characteristic features are searched within the segmented area.
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Å°¿öµå(Keyword) |
pattern matching
alignment
characteristic features
correlation
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