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Ȩ Ȩ > ¿¬±¸¹®Çå > ±¹³» ³í¹®Áö > Çѱ¹Á¤º¸Åë½ÅÇÐȸ ³í¹®Áö (Journal of the Korea Institute of Information and Communication Engineering)

Çѱ¹Á¤º¸Åë½ÅÇÐȸ ³í¹®Áö (Journal of the Korea Institute of Information and Communication Engineering)

Current Result Document :

ÇѱÛÁ¦¸ñ(Korean Title) ±âÆÇÀü¾Ð¿¡ µû¸¥ ³ª³ë¿ÍÀ̾î Junctionless MuGFETÀÇ Àü·ù-Àü¾Ð Ư¼º
¿µ¹®Á¦¸ñ(English Title) Current-Voltage Characteristics with Substrate Bias in Nanowire Junctionless MuGFET
ÀúÀÚ(Author) ÀÌÀç±â   ¹ÚÁ¾Å   Jae-Ki Lee   Jong-Tae Park  
¿ø¹®¼ö·Ïó(Citation) VOL 16 NO. 04 PP. 0785 ~ 0792 (2012. 04)
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(Korean Abstract)
º» ¿¬±¸¿¡¼­´Â °í¼Ó ¹× ÀúÀü·Â ½ºÀ§Äª ¼ÒÀÚ ÀÀ¿ëÀ» À§ÇÏ¿© n-ä³Î ¹«Á¢ÇÕ ¹× ¹ÝÀü¸ðµå MuGFET ¿Í p-ä³Î ¹«Á¢ÇÕ ¹× ÃàÀû¸ðµå MuGFETÀÇ ±âÆÇÀü¾Ð¿¡ µû¸¥ Àü·ù-Àü¾Ð Ư¼ºÀ» ÃøÁ¤ÇÏ°í ºñ±³ ºÐ¼®ÇÏ¿´´Ù. ±âÆÇÀü¾Ð¿¡ µû¸¥ ¹®ÅÎÀü¾Ð°ú Æ÷È­ µå·¹ÀÎ Àü·ù º¯È­·ÎºÎÅÍ n-ä³Î ¼ÒÀÚ¿¡¼­´Â ¹ÝÀü¸ðµå ¼ÒÀÚ°¡ ¹«Á¢ÇÕ ¼ÒÀÚº¸´Ù º¯È­·®ÀÌ Å©¸ç p-ä³Î ¼ÒÀÚ¿¡¼­´Â ¹«Á¢ÇÕ ¼ÒÀÚ°¡ ÃàÀû¸ðµå ¼ÒÀÚº¸´Ù º¯È­·®ÀÌ Å« °ÍÀ» ¾Ë ¼ö ÀÖ¾ú´Ù. Àü´ÞÄÁ´öÅϽº º¯È­´Â n-ä³Î ¼ÒÀÚº¸´Ù p-ä³Î ¼ÒÀÚÀÇ º¯È­·®ÀÌ Å« °ÍÀ» ¾Ë ¼ö ÀÖ¾ú´Ù. ±×¸®°í subthreshold swing Ư¼ºÀ¸·ÎºÎÅÍ n-ä³Î ¼ÒÀÚ¿Í p-ä³Î ¹«Á¢ÇÕ ¼ÒÀÚ´Â ±âÆÇÀü¾Ð º¯È­¿¡ µû¶ó S°ªÀÇ º¯È­°¡ °ÅÀÇ ¾øÁö¸¸ p-ä³Î ÃàÀû¸ðµå ¼ÒÀÚ´Â ±âÆÇÀü¾ÐÀÌ ¾çÀÇ ¹æÇâÀ¸·Î Áõ°¡ÇÒ ¶§ S °ªÀÌ Áõ°¡ÇÏ´Â °ÍÀ¸·Î °üÃøµÇ¾ú´Ù. ±âÆÇÀü¾ÐÀ» ÀÌ¿ëÇÑ °í¼Ó ¹× ÀúÀü·Â ½ºÀ§Äª ¼ÒÀÚ ÀÀ¿ë Ãø¸é¿¡¼­´Â n-ä³Î¼ÒÀÚ¿¡¼­´Â ¹ÝÀü¸ðµå ¼ÒÀÚ°¡ p-ä³Î ¼ÒÀÚ¿¡¼­´Â ¹«Á¢ÇÕ ¼ÒÀÚ°¡ ´õ ÁÁÀº Ư¼ºÀ» º¸¿´´Ù.
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(English Abstract)
In this paper, a current-voltage characteristics of n-channel junctionless and inversion mode(IM) MuGFET, and p-channel junctionless and accumulation mode(AM) MuGFET has been measured and analyzed for the application in high speed and low power switching devices. From the variation of the threshold voltage and the saturation drain current with the substrate bias voltages, their variations in IM devices are larger than junctionless devices for n-channel devices, but their variations in junctioness devices are larger than AM devices for p-channel devices. The variations of transconductance with substrate biases are more significant in p-channel devices than n-channel devices. From the characteristics of subthreshold swing, it was observed that the S value is almost independent on the substrate biases in n-channel devices and p-channel junctionless devices but it is increased with the increase of the substrate biases in p-channel AM devices. For the application in high speed and low power switching devices using the substrate biases, IM device is better than junctionless devices for n-channel devices and junctionless device is better than AM devices for p-channel devices.
Å°¿öµå(Keyword) ¹«Á¢ÇÕ MuGFET   ¹ÝÀü¸ðµå MuGFET   ÃàÀû¸ðµå MuGFET   ±âÆÇ ¹ÙÀ̾ È¿°ú   Junctionless MuGFET   Inversion mode MuGFET   Accumulation mode MuGFET   Substrate bias effect  
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