2012³âµµ ÀÎÅͳÝÁ¤º¸ÇÐȸ ÇÏ°èÇмú¹ßÇ¥´ëȸ
Current Result Document : 11 / 11
ÇѱÛÁ¦¸ñ(Korean Title) |
ÀÓº£µðµå ½Ã½ºÅÛÀÇ ¼ÒÇÁÆ®¿þ¾î ÀÎÅÍÆäÀ̽º °áÇÔ Çã¿ë¼º Çâ»ó Å×½ºÆ® Á¢±Ù ±â¹ý |
¿µ¹®Á¦¸ñ(English Title) |
Test Approach on Improving the Fault Tolerance of Software Interface in the Embedded Systems |
ÀúÀÚ(Author) |
ÃÖÀÎÈ
¹éÁ¾È£
ȲÁØ
Inhwa Choi
Jongho Paik
Jun Hwang
|
¿ø¹®¼ö·Ïó(Citation) |
VOL 13 NO. 01 PP. 0155 ~ 0156 (2012. 06) |
Çѱ۳»¿ë (Korean Abstract) |
º» ³í¹®¿¡¼´Â Çϵå¿þ¾î ¸ðµâÀ» Àç»ç¿ëÇÏ´Â ÀÓº£µðµå ½Ã½ºÅÛ¿¡¼ ¹ß»ýÇÒ ¼ö ÀÖ´Â ¼ÒÇÁÆ®¿þ¾î ÀÎÅÍÆäÀ̽º °áÇÔ¿¡ ´ëÇÑ ±¸Á¶ÀûÀÎ Å×½ºÆ® Á¢±Ù ±â¹ýÀ» Á¦¾ÈÇÑ´Ù. Á¦¾ÈµÈ Å×½ºÆ® Á¢±Ù ±â¹ýÀÇ ¿ì¼ö¼ºÀ» °ËÁõÇϱâ À§ÇØ »ó¿ë Á¦Ç°ÀÎ µðÁöÅÐ ¶óµð¿À ¹æ¼Û ¼ö½Å±â¸¦ ´ë»óÀ¸·Î Å×½ºÆ®¸¦ ¼öÇàÇÏ¿© ±âÁ¸ ¹æ½Ä°ú ºñ±³ÇÏ¿© Ãß°¡ÀûÀÎ Å×½ºÆ® ½Ã³ª¸®¿À »ý¼º ´ëºñ 28.8%ÀÇ °áÇÔÀ» Ãß°¡·Î ¹ß°ßÇÏ¿© ÀÎÅÍÆäÀ̽º °áÇÔ Çã¿ë¼ºÀ» º¸´Ù Çâ»ó½Ãų ¼ö ÀÖ¾ú´Ù.
|
¿µ¹®³»¿ë (English Abstract) |
|
Å°¿öµå(Keyword) |
|
ÆÄÀÏ÷ºÎ |
PDF ´Ù¿î·Îµå
|