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컴퓨터연구정보센터::연구문헌
[ 자주찾는 논문 TOP 10 ]
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검색어 "Seong-jun Kang"에 대한 [연구문헌] 검색결과 입니다.

영문 논문지 총 7건이 검색되었습니다.

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1 제목(Title) Influence of the Precursor Solutions on the Properties of BST Thin Films
저자(Author) Seong-Jun Kang   Yang-Hee Joung  
수록저널(Journal) JICCE(Journal of information and communication convergence engineering)
원문수록처(Citation) VOL 01 NO. 02 PP. 0070 ~ 0073 2003. 06
2 제목(Title) Etch Rate of Oxide Grown on Silicon Implanted with Different Ion Implantation Conditions prior to Oxidation
저자(Author) Yang-Hee Joung   Seong-Jun Kang  
수록저널(Journal) JICCE(Journal of information and communication convergence engineering)
원문수록처(Citation) VOL 01 NO. 02 PP. 0067 ~ 0069 2003. 06
3 제목(Title) Improvement of Channel Estimation Algorithm in Mobile/Satellite Communication Systems
저자(Author) Byung-Gi Kim   Sang-Jin Ryoo   Chang-Hun Lee   Kwang-Seok Choi   Seong-Hwan Kim   Seong-Jun Kang   Cheol-Hun Na  
수록저널(Journal) JICCE(Journal of information and communication convergence engineering)
원문수록처(Citation) VOL 07 NO. 03 PP. 0404 ~ 0411 2009. 09
4 제목(Title) The role of EL2 in the infrared transmission images of defects in semi-insulating GaAs
저자(Author) Seong-Jun Kang   Sung-Seok Lee  
수록저널(Journal) JICCE(Journal of information and communication convergence engineering)
원문수록처(Citation) VOL 09 NO. 06 PP. 0725 ~ 0728 2011. 12
5 제목(Title) Humidity Induced Defect Generation and Its Control during Organic Bottom anti-reflective Coating in the Photo Lithography Process of Semiconductors
저자(Author) Seong-Yeol Mun   Seong-Jun Kang   Yang-Hee Joung  
수록저널(Journal) JICCE(Journal of information and communication convergence engineering)
원문수록처(Citation) VOL 10 NO. 03 PP. 0295 ~ 0299 2012. 09
6 제목(Title) Device Characteristics and Hot Carrier Lifetime Characteristics Shift Analysis by Carbon Implant used for Vth Adjustment
저자(Author) Seong-Yeol Mun   Seong-Jun Kang   Yang-Hee Joung  
수록저널(Journal) JICCE(Journal of information and communication convergence engineering)
원문수록처(Citation) VOL 11 NO. 04 PP. 0288 ~ 0292 2013. 12
7 제목(Title) A Method for Measuring the Energy Gap of a Semiconductor using Infrared Imaging Technique
저자(Author) Seong-Jun Kang  
수록저널(Journal) Journal of EEIS
원문수록처(Citation) VOL 04 NO. 01 PP. 0043 ~ 0048 1999. 02
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