2108 | DBT 2005 : IEEE International Workshop on Current & Defect Based Testing
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¸¶°¨ÀÏÀÚ | 2005/01/15 | ±¹³»/±¹¿Ü | |
ȨÆäÀÌÁö | http://www.cs.colostate.edu/%7emalaiya/dbt.html | Àå ¼Ò | |
DBT 2005 : IEEE International Workshop on Current & Defect Based Testing May 1, 2005 Lodge at Rancho Mirage, Palm Springs, CA, USA Important Dates: -Submission of Extended Abstract: Jan 15, 2005 -Notification of Acceptance: Feb 15, 2005 -Camera Ready Paper: Mar 15, 2005 |
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